Features:
• PolyGate™ technology with Multi-Gate™ and Probing-Gate™ functions capable of single and multi-focus imaging
• Up to 100 gates per channel with 2 Gsps sampling rate
• Windows® 7 Ultimate for multi-language and 64-bit capabilities
• Inertially Balanced Linear Motor Scanner with counterweight to minimize vibrations and ensure optimal scanning results
• Tower-mounted scan reference platform and sample fixture
• Open-access scanning area makes loading and unloading easy and is capable of scanning JEDEC trays or a 300mm wafer
• Water recirculation and optional inline temperature control
•SonoSimulator for simplified analysis of stacked die parts
• Digital Image Analysis (DIA)™ uses advanced algorithms to quantify the acoustic data and allows you to set accurate, automatic, accept/reject criteria
• Virtual Rescanning Mode (VRM)™ stores comprehensive data and enables you to perform a complete analysis of a sample, even when it is no longer available